Chien-Wei Wu, - and Armin Darmawan, - and Shih-Wen Liu, - (2022) Stage-independent multiple sampling plan by variables inspection for lot determination based on the process capability index Cpk. INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH.
Chien-Wei Wu, - and Armin Darmawan, - and Nien-Yun Wu, - A double sampling plan for truncated life tests under two-parameter Lindley distribution. Annals of Operations Research, 2024.
Chien-Wei Wu, - and Armin Darmawan, - A modified sampling scheme for lot sentencing based on the third-generation capability index. Annals of Operations Research, 2023.